豊川 秀訓
著者に関連した記事は5件です。
更新情報
論文
2 次元検出器による内部ひずみ評価法
著者:
鈴木 賢治,Kenji SUZUKI,菖蒲 敬久,Takahisa SHOBU,城 鮎美,Ayumi SHIRO,豊川 秀訓,Hidenori TOYOKAWA
発刊日:
公開日:
キーワードタグ:
Area Detector Rotating-slit Synchrotron X-Ray Stress Measurement
鈴木 賢治,Kenji SUZUKI,菖蒲 敬久,Takahisa SHOBU,城 鮎美,Ayumi SHIRO,豊川 秀訓,Hidenori TOYOKAWA
発刊日:
公開日:
キーワードタグ:
Area Detector Rotating-slit Synchrotron X-Ray Stress Measurement
An area detector technique has to be applied to the strain scanning method for materials with coarse grains. A new rotating slit system was designed for a 2-dimensional (2D) detector strain scanning method. The rotating slit system can focus the 2D detector on the center of the goniometer, and the gauge volume is made by the rotating slit system. The stress measurements were examined with the rotating slit and 2D detector. The measured diffraction spots shifted for the 2D strain scanning. The magnitu...
英字タイトル:
Evaluation of Internal Stresses using Area Detectors
英字タイトル:
Evaluation of Internal Stresses using Area Detectors
第8回
2次元検出器による内部ひずみ評価法の研究
著者:
鈴木 賢治,Kenji SUZUKI,菖蒲 敬久,Takahisa SHOBU,城 帖美,Ayumi SHIRO,豊川 秀訓,Hidenori TOYOKAWA
発刊日:
公開日:
キーワードタグ:
Coarse grain PILATUS Rotating-slit Synchrotron X-Ray Stress Measurement
鈴木 賢治,Kenji SUZUKI,菖蒲 敬久,Takahisa SHOBU,城 帖美,Ayumi SHIRO,豊川 秀訓,Hidenori TOYOKAWA
発刊日:
公開日:
キーワードタグ:
Coarse grain PILATUS Rotating-slit Synchrotron X-Ray Stress Measurement
An area detector technique has to be applied to the strain scanning method for the coarse grains. A new rotating slit system was designed for a 2-dimensional (2D) detector strain scanning method. The rotating slit system focuses the 2D detector on the center of the goniometer, an d the gauge volume is made by the rotating slit system. The stress measurements were examined by the rotating slit and 2D detector. The measured diffraction spots shifted for the 2D strain scanning. The magnitude of the shift of t...
英字タイトル:
Study on Evaluation of Internal Stresses using Area Detector
英字タイトル:
Study on Evaluation of Internal Stresses using Area Detector
第16回
CdTeピクセル検出器と放射光白色Ｘ線による応力評価への挑戦
著者:
鈴木 賢治,（新潟大),城 鮎美,（量研機構),豊川 秀訓,佐治 超爾,（高輝度光科学研究センター),菖蒲 敬久,（JAEA)
発刊日:
公開日:
キーワードタグ:
CdTe Pixel Detector Coarse Grain Double Exposure Method Syn- chrotron White X-ray X-Ray Stress Measurement
鈴木 賢治,（新潟大),城 鮎美,（量研機構),豊川 秀訓,佐治 超爾,（高輝度光科学研究センター),菖蒲 敬久,（JAEA)
発刊日:
公開日:
キーワードタグ:
CdTe Pixel Detector Coarse Grain Double Exposure Method Syn- chrotron White X-ray X-Ray Stress Measurement
In this study, we proposed a double exposure method using synchrotron white X-rays (DEM-WX) to measure strains of coarse-grained materials, and examined its feasibility. The X-ray diffractions were measured by a CdTe pixel detector. The CdTe pixel detector can resolve photon energy by changing a threshold voltage. Calibrating each pixel of the detector using characteristic X-rays of Pb and W foils, the images by threshold X-ray energy were obtained. The difference image, which is like a diffraction image wi...
英字タイトル:
Feasibility Study on Stress Measurements using CdTe Pixel Detector and Synchrotron White X-Rays
英字タイトル:
Feasibility Study on Stress Measurements using CdTe Pixel Detector and Synchrotron White X-Rays
会員のみダウンロード可能
論文
直接法による残留応力の測定
著者:
鈴木 賢治,Kenji SUZUKI,豊川 秀訓,Hidenori TOYOKAWA
発刊日:
公開日:
キーワードタグ:
Direct-Method PILATUS Residual Stress Shrink Fitting Weld Part X-Ray
鈴木 賢治,Kenji SUZUKI,豊川 秀訓,Hidenori TOYOKAWA
発刊日:
公開日:
キーワードタグ:
Direct-Method PILATUS Residual Stress Shrink Fitting Weld Part X-Ray
This paper describes a stress measurement using a direct-method. In the direct-method, the stress is measured by the normal incident X-ray beam, one exposure and an area detector. The direct-method needs a narrow incident beam, so that the beam was made by the graphite monochromator. The welded specimen of SUS316L and the shrink-fitted specimen of SUS304 were prepared, and the distributions of the residual stresses of these specimens were measured using the direct-method. It was possible to measure the weld ...
英字タイトル:
Residual Stress Measurements using Direct-Method
英字タイトル:
Residual Stress Measurements using Direct-Method
第17回
高エネルギー放射光によるオーステナイト系ステンレス鋼の応力測定
著者:
鈴木 賢治,（新潟大）,城 鮎美,（量研機構）,菖蒲 敬久,（JAEA）,豊川 秀訓, 佐治 超爾,（JASRI）
発刊日:
公開日:
キーワードタグ:
Austenitic Stainless Steel CCD Camera CdTe Pixel Detector Double Exposure Method Hard Synchrotron X-rays X-Ray Stress Measurement
鈴木 賢治,（新潟大）,城 鮎美,（量研機構）,菖蒲 敬久,（JAEA）,豊川 秀訓, 佐治 超爾,（JASRI）
発刊日:
公開日:
キーワードタグ:
Austenitic Stainless Steel CCD Camera CdTe Pixel Detector Double Exposure Method Hard Synchrotron X-rays X-Ray Stress Measurement
In this study, stress measurements were performed using a double exposure method with hard synchrotron monochromatic X-rays, and its validity was proved. The diffractions of the shrink-?tted ring of austenitic stainless steel SUS304 were measured by the CdTe pixel detector. The used X-rays were 70, 80 and 90 keV. The measured stress distributions with the 311 diffraction of γ-Fe corresponded to the predicted result. In addition, The stress distribution of the shrink-?tted ring was measured by the CCD camera...
英字タイトル:
Stress Measurements of Austenitic Stainless Steel using Hard Synchrotron X-Rays
英字タイトル:
Stress Measurements of Austenitic Stainless Steel using Hard Synchrotron X-Rays